Atomic Force Microscope NT-MDT NTEGRA Probe NanoLaboratory
Instrument Description:
The NTEGRA Probe atomic force microscope enables surface topography characterization, Kelvin probe measurements, and phase imaging.
Key Features:
- Measurement in tapping mode
- Measurement in air
- Imaging of polymer spherulites, thin films, nanoparticles, thin organic films, biomacromolecules, nanofibers
- Visualization of magnetic and electric domains, Kelvin probe, phase contrast
- Maximum scanning range 100×100×10 µm
Location:
Department of Physics and Material Engineering
Responsible Person:
Name: Assoc. Prof. Antonín Minařík, Ph.D.
Phone: +420 57 603 5086
Mobile: +420 603 929 933
E-mail: minarik@utb.cz
Office: U15/439