Tomas Bata University in Zlín

About the Department

Atomic Force Microscope NT-MDT NTEGRA Probe NanoLaboratory

Instrument Description:
The NTEGRA Probe atomic force microscope enables surface topography characterization, Kelvin probe measurements, and phase imaging.

Key Features:

  • Measurement in tapping mode
  • Measurement in air
  • Imaging of polymer spherulites, thin films, nanoparticles, thin organic films, biomacromolecules, nanofibers
  • Visualization of magnetic and electric domains, Kelvin probe, phase contrast
  • Maximum scanning range 100×100×10 µm

Location:
Department of Physics and Material Engineering

Responsible Person:
Name:             Assoc. Prof. Antonín Minařík, Ph.D.
Phone:             +420 57 603 5086
Mobile:           +420 603 929 933
E-mail:             minarik@utb.cz
Office:             U15/439

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